Detector Characterization
From ITLWiki
We provide detector testing as a service to the community.
The Imaging Technology Laboratory has formed a Detector Characterization Program as a service to the scientific and industrial imaging community. We perform a wide range of detector tests for a nominal fee. Our goal is to provide rapid feedback of device performance using well proven and calibrated techniques.
Our present services are listed below with more to come. Please email special requests (lesser@itl.arizona.edu). Combinations of these tests as well as characterization at various temperatures are possible.
Standard Cold Imaging Test
- Charge Transfer Efficiency at 1620 electrons (Fe-55)
- Readout noise
- Amplifier gain
- Photo Response Non Uniformity at 400, 600, and 900 nm
- Dark Current
- Quantum Efficiency Tests
- QE at room temperature in diode mode (200 - 300 and 300 - 1100 nm)
- QE at reduced temperature in diode mode (300 - 1100 nm)
- QE in imaging mode (300 - 1100 nm)
Misc
All the testing is automated and script driven, requiring no operator intervention once the device is set up. We have developed an automated system using LabView programming for measuring the quantum efficiency (QE) of devices. Other tests include read noise (down to 1.0 electrons), gain, full well capacity, linearity, photoresponse non-uniformity, dark current and dark-current non-uniformity, and charge transfer efficiency (CTE).
